Hot-Carrier Effects in MOS Devices
Eiji Takeda (Hitachi Ltd.),Cary Y. Yang (Santa Clara University),Akemi Miura-Hamada (Hitachi Ltd.)
Hot-Carrier Effects in MOS Devices
Eiji Takeda (Hitachi Ltd.),Cary Y. Yang (Santa Clara University),Akemi Miura-Hamada (Hitachi Ltd.)
The exploding number of uses for ultrafast, ultrasmall integrated circuits has increased the importance of hot-carrier effects in manufacturing as well as for other technological applications. They are rapidly movingout of the research lab and into the real world.
This book is derived from Dr. Takedas book in Japanese, Hot-Carrier Effects, (published in 1987 by Nikkei Business Publishers). However, the new book is much more than a translation. Takedas original work was a starting point for developing this much more complete and fundamental text on this increasingly important topic. The new work encompasses not only all the latest research and discoveries made in the fast-paced area of hot carriers, but also includes the basics of MOS devices, and the practical considerations related to hot carriers.
This item is not currently in-stock. It can be ordered online and is expected to ship in approx 2 weeks
Our stock data is updated periodically, and availability may change throughout the day for in-demand items. Please call the relevant shop for the most current stock information. Prices are subject to change without notice.
Sign in or become a Readings Member to add this title to a wishlist.