Search results for ‘Eiji Takeda (Hitachi Ltd.),Cary Y. Yang (Santa Clara University),Akemi Miura-Hamada (Hitachi Ltd.)’

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      Cover image for Hot-Carrier Effects in MOS Devices
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      Hot-Carrier Effects in MOS Devices

      Eiji Takeda (Hitachi Ltd.),Cary Y. Yang (Santa Clara University),Akemi Miura-Hamada (Hitachi Ltd.)

      This book is derived from Dr. Takeda’s book in Japanese, Hot-Carrier Effects. The new work encompasses not only all the latest research and discoveries made in the area of hot…

      $287.99

      Available to order, ships in approx 2 weeksAvailable to order