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Home / Infrared Characterization For Microelectronics
Infrared Characterization For Microelectronics
Hardback

Infrared Characterization For Microelectronics

Wai Shing Lau (Formerly Ntu, S'pore)
$170.99
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The focus of this text is on practical applications useful to the production line and to the research and development of microelectronics. The background knowledge and significance of doing a particular type of infrared measurement is discussed in detail. The principal purpose of the book is to serve as a useful handbook for practising engineers and scientists in the field of microelectronics.

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MORE INFO
Format
Hardback
Publisher
World Scientific Publishing Co Pte Ltd
Country
Singapore
Date
4 October 1999
Pages
172
ISBN
9789810223526

The focus of this text is on practical applications useful to the production line and to the research and development of microelectronics. The background knowledge and significance of doing a particular type of infrared measurement is discussed in detail. The principal purpose of the book is to serve as a useful handbook for practising engineers and scientists in the field of microelectronics.

Read More
Format
Hardback
Publisher
World Scientific Publishing Co Pte Ltd
Country
Singapore
Date
4 October 1999
Pages
172
ISBN
9789810223526

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