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This title is printed to order. This book may have been self-published. If so, we cannot guarantee the quality of the content. In the main most books will have gone through the editing process however some may not. We therefore suggest that you be aware of this before ordering this book. If in doubt check either the author or publisher’s details as we are unable to accept any returns unless they are faulty. Please contact us if you have any questions.
This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2014; comprising the International Workshop on Structural and Syntactic Pattern Recognition, SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The total of 25 full papers and 22 poster papers included in this book were carefully reviewed and selected from 78 submissions. They are organized in topical sections named: graph kernels; clustering; graph edit distance; graph models and embedding; discriminant analysis; combining and selecting; joint session; metrics and dissimilarities; applications; partial supervision; and poster session.
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This title is printed to order. This book may have been self-published. If so, we cannot guarantee the quality of the content. In the main most books will have gone through the editing process however some may not. We therefore suggest that you be aware of this before ordering this book. If in doubt check either the author or publisher’s details as we are unable to accept any returns unless they are faulty. Please contact us if you have any questions.
This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2014; comprising the International Workshop on Structural and Syntactic Pattern Recognition, SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The total of 25 full papers and 22 poster papers included in this book were carefully reviewed and selected from 78 submissions. They are organized in topical sections named: graph kernels; clustering; graph edit distance; graph models and embedding; discriminant analysis; combining and selecting; joint session; metrics and dissimilarities; applications; partial supervision; and poster session.