Strutural Analysis of Point Defects in Solids introduces the principles and techniques of modern electron paramagnetic resonance (EPR) spectroscopy

essentialfor applications to the determination of microscopic

defect structures. Investigations of the microscopic and

electronic structure, and also correlations with the magnetic propertiesof solids, require various multiple magnetic resonance methods, such as

ENDOR and optically detected EPR or ENDOR. This book discusses

experimental, technological and theoretical aspects of these

techniques comprehensively, from a practical viewpoint, with

many illustrative examples taken from semiconductors and other solids. The nonspecialist is informed about the potential of the different methods, while the researcher faced with the task of determining defect structures isprovided with the necessary tools, together with much information

on computer-aided methods of data analysis and the principles of modern spectrometer design.