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Studies of Nanoconstrictions, Nanowires and Fe3O4 Thin Films: Electrical Conduction and Magnetic Properties. Fabrication by Focused Electron/Ion Beam
Hardback

Studies of Nanoconstrictions, Nanowires and Fe3O4 Thin Films: Electrical Conduction and Magnetic Properties. Fabrication by Focused Electron/Ion Beam

$276.99
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This title is printed to order. This book may have been self-published. If so, we cannot guarantee the quality of the content. In the main most books will have gone through the editing process however some may not. We therefore suggest that you be aware of this before ordering this book. If in doubt check either the author or publisher’s details as we are unable to accept any returns unless they are faulty. Please contact us if you have any questions.

This work constitutes a detailed study of electrical and magnetic properties in nanometric materials with a range of scales: atomic-sized nanoconstrictions, micro- and nanowires and thin films. Firstly, a novel method of fabricating atomic-sized constrictions in metals is presented; it relies on measuring the conduction of the device while a focused-ion-beam etching process is in progress.

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MORE INFO
Format
Hardback
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Country
Germany
Date
24 January 2011
Pages
188
ISBN
9783642158001

This title is printed to order. This book may have been self-published. If so, we cannot guarantee the quality of the content. In the main most books will have gone through the editing process however some may not. We therefore suggest that you be aware of this before ordering this book. If in doubt check either the author or publisher’s details as we are unable to accept any returns unless they are faulty. Please contact us if you have any questions.

This work constitutes a detailed study of electrical and magnetic properties in nanometric materials with a range of scales: atomic-sized nanoconstrictions, micro- and nanowires and thin films. Firstly, a novel method of fabricating atomic-sized constrictions in metals is presented; it relies on measuring the conduction of the device while a focused-ion-beam etching process is in progress.

Read More
Format
Hardback
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Country
Germany
Date
24 January 2011
Pages
188
ISBN
9783642158001