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Self-Trapped Excitons
Paperback

Self-Trapped Excitons

$353.99
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This title is printed to order. This book may have been self-published. If so, we cannot guarantee the quality of the content. In the main most books will have gone through the editing process however some may not. We therefore suggest that you be aware of this before ordering this book. If in doubt check either the author or publisher’s details as we are unable to accept any returns unless they are faulty. Please contact us if you have any questions.

Discussing the structure and evolution of the self-trapped exciton (STE) in a range of materials, this work includes a comprehensive review of experiments and extensive tables of data. Emphasis is given throughout to the unity of the basic physics underlying various manifestations of self-trapping, with the theory being developed from a localized, atomistic perspective. The topics treated in detail in relation to STE relaxation include spontaneous symmetry breaking, lattice defect formation, radiation damage and electronic sputtering.

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MORE INFO
Format
Paperback
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Country
Germany
Date
18 March 1996
Pages
410
ISBN
9783540604464

This title is printed to order. This book may have been self-published. If so, we cannot guarantee the quality of the content. In the main most books will have gone through the editing process however some may not. We therefore suggest that you be aware of this before ordering this book. If in doubt check either the author or publisher’s details as we are unable to accept any returns unless they are faulty. Please contact us if you have any questions.

Discussing the structure and evolution of the self-trapped exciton (STE) in a range of materials, this work includes a comprehensive review of experiments and extensive tables of data. Emphasis is given throughout to the unity of the basic physics underlying various manifestations of self-trapping, with the theory being developed from a localized, atomistic perspective. The topics treated in detail in relation to STE relaxation include spontaneous symmetry breaking, lattice defect formation, radiation damage and electronic sputtering.

Read More
Format
Paperback
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Country
Germany
Date
18 March 1996
Pages
410
ISBN
9783540604464