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Home / Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products
Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products
Hardback

Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products

Richard Bowen (i-NewtonWales, Swansea, UK),Nidal Hilal (NYUAD Water Research Center, New York University - Abu Dhabi Campus, Abu Dhabi, United Arab Emirates)
$234.95
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  1. Basic Principles of Atomic Force Microscopy Daniel Johnson, Nid al Hilal, W. Richard Bowen

  2. Measurement of Particle and Surface Interactions Using Force Microscopy Nidal Hilal, Daniel Johnson, W. Richard Bowen, Paul M. Williams

  3. Quantification of Particle-Bub ble Interactions Using Atomic Force Microscopy Nidal Hilal, Daniel Jo hnson

  4. Investigating Membranes and Membrane Processes with A tomic Force Microscopy W. Richard Bowen, Nidal Hilal

  5. AFM an d Development of (Bio)Fouling Resistant Membranes Nidal Hilal, W. Ric hard Bowen, Daniel Johnson, Huabing Yin

  6. Nanoscale Analysis of Pharmaceuticals by Scanning Probe Microscopy Clive J. Roberts

  7. Micro/Nanoengineering and AFM for Cellular Sensing Huabing Yin, Go rdon McPhee, Phil Dobson

  8. Atomic Force Microscopy and Polymers on Surfaces Vasileios Koutsos

  9. Application of AFM for the St udy of Tensile and Microrheological Properties of Fluids Matthew S. B arrow, P. Rhodri Williams

  10. Future Prospects W. Richard Bowe n and Nidal Hilal

Read More
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MORE INFO
Format
Hardback
Publisher
Elsevier Science & Technology
Country
United Kingdom
Date
3 July 2009
Pages
304
ISBN
9781856175173

  1. Basic Principles of Atomic Force Microscopy Daniel Johnson, Nid al Hilal, W. Richard Bowen

  2. Measurement of Particle and Surface Interactions Using Force Microscopy Nidal Hilal, Daniel Johnson, W. Richard Bowen, Paul M. Williams

  3. Quantification of Particle-Bub ble Interactions Using Atomic Force Microscopy Nidal Hilal, Daniel Jo hnson

  4. Investigating Membranes and Membrane Processes with A tomic Force Microscopy W. Richard Bowen, Nidal Hilal

  5. AFM an d Development of (Bio)Fouling Resistant Membranes Nidal Hilal, W. Ric hard Bowen, Daniel Johnson, Huabing Yin

  6. Nanoscale Analysis of Pharmaceuticals by Scanning Probe Microscopy Clive J. Roberts

  7. Micro/Nanoengineering and AFM for Cellular Sensing Huabing Yin, Go rdon McPhee, Phil Dobson

  8. Atomic Force Microscopy and Polymers on Surfaces Vasileios Koutsos

  9. Application of AFM for the St udy of Tensile and Microrheological Properties of Fluids Matthew S. B arrow, P. Rhodri Williams

  10. Future Prospects W. Richard Bowe n and Nidal Hilal

Read More
Format
Hardback
Publisher
Elsevier Science & Technology
Country
United Kingdom
Date
3 July 2009
Pages
304
ISBN
9781856175173

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