Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products
Richard Bowen (i-NewtonWales, Swansea, UK),Nidal Hilal (NYUAD Water Research Center, New York University - Abu Dhabi Campus, Abu Dhabi, United Arab Emirates)
Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products
Richard Bowen (i-NewtonWales, Swansea, UK),Nidal Hilal (NYUAD Water Research Center, New York University - Abu Dhabi Campus, Abu Dhabi, United Arab Emirates)
Basic Principles of Atomic Force Microscopy Daniel Johnson, Nid al Hilal, W. Richard Bowen
Measurement of Particle and Surface Interactions Using Force Microscopy Nidal Hilal, Daniel Johnson, W. Richard Bowen, Paul M. Williams
Quantification of Particle-Bub ble Interactions Using Atomic Force Microscopy Nidal Hilal, Daniel Jo hnson
Investigating Membranes and Membrane Processes with A tomic Force Microscopy W. Richard Bowen, Nidal Hilal
AFM an d Development of (Bio)Fouling Resistant Membranes Nidal Hilal, W. Ric hard Bowen, Daniel Johnson, Huabing Yin
Nanoscale Analysis of Pharmaceuticals by Scanning Probe Microscopy Clive J. Roberts
Micro/Nanoengineering and AFM for Cellular Sensing Huabing Yin, Go rdon McPhee, Phil Dobson
Atomic Force Microscopy and Polymers on Surfaces Vasileios Koutsos
Application of AFM for the St udy of Tensile and Microrheological Properties of Fluids Matthew S. B arrow, P. Rhodri Williams
Future Prospects W. Richard Bowe n and Nidal Hilal
This item is not currently in-stock. It can be ordered online and is expected to ship in approx 2 weeks
Our stock data is updated periodically, and availability may change throughout the day for in-demand items. Please call the relevant shop for the most current stock information. Prices are subject to change without notice.
Sign in or become a Readings Member to add this title to a wishlist.