Scanning Microscopy for Nanotechnology: Techniques and Applications

Scanning Microscopy for Nanotechnology: Techniques and Applications
Format
Paperback
Publisher
Springer-Verlag New York Inc.
Country
United States
Published
29 October 2010
Pages
522
ISBN
9781441922090

Scanning Microscopy for Nanotechnology: Techniques and Applications

This title is printed to order. This book may have been self-published. If so, we cannot guarantee the quality of the content. In the main most books will have gone through the editing process however some may not. We therefore suggest that you be aware of this before ordering this book. If in doubt check either the author or publisher’s details as we are unable to accept any returns unless they are faulty. Please contact us if you have any questions.

This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

This item is not currently in-stock. It can be ordered online and is expected to ship in 7-14 days

Our stock data is updated periodically, and availability may change throughout the day for in-demand items. Please call the relevant shop for the most current stock information. Prices are subject to change without notice.

Sign in or become a Readings Member to add this title to a wishlist.