Strain Effect in Semiconductors: Theory and Device Applications

Yongke Sun,Scott E. Thompson,Toshikazu Nishida,Sun Yongyin

Strain Effect in Semiconductors: Theory and Device Applications
Format
Hardback
Publisher
Springer-Verlag New York Inc.
Country
United States
Published
4 December 2009
Pages
350
ISBN
9781441905512

Strain Effect in Semiconductors: Theory and Device Applications

Yongke Sun,Scott E. Thompson,Toshikazu Nishida,Sun Yongyin

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Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. Discusses relevant applications of strain while also focusing on the fundamental physics pertaining to bulk, planar, and scaled nano-devices. Hence, this book is relevant for current strained Si logic technology as well as for understanding the physics and scaling for future strained nano-scale devices.

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