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Image-Based Fractal Description of Microstructures
Hardback

Image-Based Fractal Description of Microstructures

$276.99
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This title is printed to order. This book may have been self-published. If so, we cannot guarantee the quality of the content. In the main most books will have gone through the editing process however some may not. We therefore suggest that you be aware of this before ordering this book. If in doubt check either the author or publisher’s details as we are unable to accept any returns unless they are faulty. Please contact us if you have any questions.

Fractal analysis has rapidly become an important field in materials science and engineering with broad applications to theoretical analysis and quantitative description of microstructures of materials. Fractal methods have thus far shown great potential in engineering applications in quantitative microscopic analysis of materials using commercial microscopes. This book introduces the fundamentals and the basis methods of fractal description of microstructures in combination with digital imaging and computer technologies. Basic concepts are given in the form of mathematical expressions. Detailed algorithms in practical applications are also provided. Fractal measurement, error analysis and fractal description of cluster growth, thin films and surfaces are emphasized in this book. It provides a comprehensive approach to materials characterization by fractal from theory to application and is therefore an essential source of reference for university professors, professional engineers and research students.

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MORE INFO
Format
Hardback
Publisher
Springer-Verlag New York Inc.
Country
United States
Date
31 July 2003
Pages
272
ISBN
9781402075070

This title is printed to order. This book may have been self-published. If so, we cannot guarantee the quality of the content. In the main most books will have gone through the editing process however some may not. We therefore suggest that you be aware of this before ordering this book. If in doubt check either the author or publisher’s details as we are unable to accept any returns unless they are faulty. Please contact us if you have any questions.

Fractal analysis has rapidly become an important field in materials science and engineering with broad applications to theoretical analysis and quantitative description of microstructures of materials. Fractal methods have thus far shown great potential in engineering applications in quantitative microscopic analysis of materials using commercial microscopes. This book introduces the fundamentals and the basis methods of fractal description of microstructures in combination with digital imaging and computer technologies. Basic concepts are given in the form of mathematical expressions. Detailed algorithms in practical applications are also provided. Fractal measurement, error analysis and fractal description of cluster growth, thin films and surfaces are emphasized in this book. It provides a comprehensive approach to materials characterization by fractal from theory to application and is therefore an essential source of reference for university professors, professional engineers and research students.

Read More
Format
Hardback
Publisher
Springer-Verlag New York Inc.
Country
United States
Date
31 July 2003
Pages
272
ISBN
9781402075070