Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices

Practical guidelines to develop high-power, single-spatial mode, edge-emitting diode laser products by using concepts and techniques of the complementary technical areas of device engineering, reliability engineering and device diagnostics The book reflects the extensive expertise of the author in the diode-laser field both as a top scientific researcher as well as a key developer of highly reliable devices. The author provides a novel approach to high-power, single-transverse mode diode laser development by addressing the complementary topics of device engineering, reliability engineering and device diagnostics. * Provides a novel approach of high power, single transverse mode diode laser development by addressing the three complementary areas of device engineering, reliability engineering and device diagnostics in the same book and thus closes the gap in the current book literature.* Furnishes comprehensive practical and problem-oriented guidelines and design considerations by taking into account also reliability related effects and functionality impacting factors such as temperature, stress and material instabilities. * Demonstrates novel diagnostic approaches and techniques and discusses in-depth and breadth concepts and technologies to enhance the optical strength in diode laser cavities and mirrors.* Discusses fundamental laser degradation mechanisms, concepts and techniques of laser reliability engineering, and provides details on setting up and operating a typical diode laser reliability test program used in industry for product qualification.* Represents a useful resource for professionals engaged in diode laser R & D.