Yield and Reliability in Microwave Circuit and System Design

Michael D. Meehan,John Purviance

Yield and Reliability in Microwave Circuit and System Design
Format
Hardback
Publisher
Artech House Publishers
Country
United States
Published
19 December 1993
Pages
300
ISBN
9780890065273

Yield and Reliability in Microwave Circuit and System Design

Michael D. Meehan,John Purviance

This reference is for anyone involved with microwave design. It tackles the practical aspects of microwave statistical design and introduces statistical design techniques that encompass many different applications. This presentation focuses on two main example areas - microwave circuits and systems - but any application with a complex relation between design variables and performance and design variable uncertainty can benefit from statistical design.

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