Become a Readings Member to make your shopping experience even easier. Sign in or sign up for free!

Become a Readings Member. Sign in or sign up for free!

Hello Readings Member! Go to the member centre to view your orders, change your details, or view your lists, or sign out.

Hello Readings Member! Go to the member centre or sign out.

Handbook of Silicon Wafer Cleaning Technology
Paperback

Handbook of Silicon Wafer Cleaning Technology

$374.95
Sign in or become a Readings Member to add this title to your wishlist.

Part 1: Introduction and Overview 1. Overview and Evolution of Silicon Wafer Cleaning Technology 2. Overview of Wafer Contamination and Defectivity Part 2: Wet-Chemical Processe s 3. Particle Deposition and Adhesion 4. Aqueo us Cleaning and Surface Conditioning Processes Part 3: Dry Cleaning Processes 5. Gas-phase Wafer Cleaning Technology6. Plasma Stripping and Cleaning 7. Cryogenic A erosols and Supercritical Fluid Cleaning Part 4: Analytical and Control Aspects 8. Detection and Measurement of Partic ulate Contaminants 9. Surface Chemical Composition and Morp hology 10. Ultratrace Impurity and Surface Morphology Analy sis 11. Analysis and Control of Electrically Active Contami nants Part 5: Directions for the Near Future

Read More
In Shop
Out of stock
Shipping & Delivery

$9.00 standard shipping within Australia
FREE standard shipping within Australia for orders over $100.00
Express & International shipping calculated at checkout

MORE INFO
Format
Paperback
Publisher
William Andrew Publishing
Country
United States
Date
10 March 2008
Pages
748
ISBN
9780815515548

Part 1: Introduction and Overview 1. Overview and Evolution of Silicon Wafer Cleaning Technology 2. Overview of Wafer Contamination and Defectivity Part 2: Wet-Chemical Processe s 3. Particle Deposition and Adhesion 4. Aqueo us Cleaning and Surface Conditioning Processes Part 3: Dry Cleaning Processes 5. Gas-phase Wafer Cleaning Technology6. Plasma Stripping and Cleaning 7. Cryogenic A erosols and Supercritical Fluid Cleaning Part 4: Analytical and Control Aspects 8. Detection and Measurement of Partic ulate Contaminants 9. Surface Chemical Composition and Morp hology 10. Ultratrace Impurity and Surface Morphology Analy sis 11. Analysis and Control of Electrically Active Contami nants Part 5: Directions for the Near Future

Read More
Format
Paperback
Publisher
William Andrew Publishing
Country
United States
Date
10 March 2008
Pages
748
ISBN
9780815515548