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Advances in the Crystallographic and Microstructural Analysis of Charge Density Wave Modulated Crystals
Hardback

Advances in the Crystallographic and Microstructural Analysis of Charge Density Wave Modulated Crystals

$367.99
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Modulated crystals have been intensively investigated over the past several years, and it is now evident that an understanding of their crystallography and microstructure is fundamental to the elucidation of the physical properties and phase transitions in these materials. This book brings together the crystallographic descriptions and experimental methods for the structural and microstructural analysis of modulated crystals, as described by well-known researchers in the various areas. The emphasis is on charge density wave modulations, and the detailed analysis of the prototypical NbTe4/TaTe4 system gives practical applications of the methods. Scanning tunnelling microscopy is a technique that provides insights into atomic scale details of the modulations’ structures and a chapter on this method is included.

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MORE INFO
Format
Hardback
Publisher
Kluwer Academic Publishers
Country
United States
Date
31 March 1999
Pages
272
ISBN
9780792356042

Modulated crystals have been intensively investigated over the past several years, and it is now evident that an understanding of their crystallography and microstructure is fundamental to the elucidation of the physical properties and phase transitions in these materials. This book brings together the crystallographic descriptions and experimental methods for the structural and microstructural analysis of modulated crystals, as described by well-known researchers in the various areas. The emphasis is on charge density wave modulations, and the detailed analysis of the prototypical NbTe4/TaTe4 system gives practical applications of the methods. Scanning tunnelling microscopy is a technique that provides insights into atomic scale details of the modulations’ structures and a chapter on this method is included.

Read More
Format
Hardback
Publisher
Kluwer Academic Publishers
Country
United States
Date
31 March 1999
Pages
272
ISBN
9780792356042