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Home / Statistical Metrology: 6th International Workshop
 
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Statistical Metrology: 6th International Workshop

Institute of Electrical and Electronics Engineers
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The proceedings of the 6th International Workshop on Statistical Metrology, held in 2001. The papers cover: yield ramping methodology; metrology for statistical process control; sensor and measurement technology; spatial and temporal variation analysis methods; robust design; and more.

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MORE INFO
Format
Paperback
Publisher
I.E.E.E.Press
Country
United States
Date
1 January 2001
Pages
100
ISBN
9780780366886

The proceedings of the 6th International Workshop on Statistical Metrology, held in 2001. The papers cover: yield ramping methodology; metrology for statistical process control; sensor and measurement technology; spatial and temporal variation analysis methods; robust design; and more.

Read More
Format
Paperback
Publisher
I.E.E.E.Press
Country
United States
Date
1 January 2001
Pages
100
ISBN
9780780366886

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