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2000 European Test Workshop (Etw) IEEE Postproceed
Paperback

2000 European Test Workshop (Etw) IEEE Postproceed

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The 25 papers cover delay testing and test scheduling, scan and functional testing, system testing, quiescent current testing, analog and mixed-signal testing, core-based testing, fault simulation and field programmable gate array testing, challenges in deep sub-micron testing, high level tests, mem

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MORE INFO
Format
Paperback
Publisher
IEEE Computer Society Press,U.S.
Country
United States
Date
1 November 2000
Pages
181
ISBN
9780769507019

The 25 papers cover delay testing and test scheduling, scan and functional testing, system testing, quiescent current testing, analog and mixed-signal testing, core-based testing, fault simulation and field programmable gate array testing, challenges in deep sub-micron testing, high level tests, mem

Read More
Format
Paperback
Publisher
IEEE Computer Society Press,U.S.
Country
United States
Date
1 November 2000
Pages
181
ISBN
9780769507019