Become a Readings Member to make your shopping experience even easier. Sign in or sign up for free!

Become a Readings Member. Sign in or sign up for free!

Hello Readings Member! Go to the member centre to view your orders, change your details, or view your lists, or sign out.

Hello Readings Member! Go to the member centre or sign out.

Integrated Circuit Failure Analysis: A Guide to Preparation Techniques
Hardback

Integrated Circuit Failure Analysis: A Guide to Preparation Techniques

$544.99
Sign in or become a Readings Member to add this title to your wishlist.

The construction and failure analysis of highly integrated semiconductor components has gained in significance with the explosive growth in the semiconductor industry. Once a subordinate laboratory task, semiconductor failure analysis has now become a discipline in its own right. The circuit designer must constantly expand the range of analytical and preparative methods, adapting them to the needs of new technologies in order to successfully locate faults and ensure optimum quality.

Read More
In Shop
Out of stock
Shipping & Delivery

$9.00 standard shipping within Australia
FREE standard shipping within Australia for orders over $100.00
Express & International shipping calculated at checkout

MORE INFO
Format
Hardback
Publisher
John Wiley and Sons Ltd
Country
United States
Date
4 February 1998
Pages
190
ISBN
9780471974017

The construction and failure analysis of highly integrated semiconductor components has gained in significance with the explosive growth in the semiconductor industry. Once a subordinate laboratory task, semiconductor failure analysis has now become a discipline in its own right. The circuit designer must constantly expand the range of analytical and preparative methods, adapting them to the needs of new technologies in order to successfully locate faults and ensure optimum quality.

Read More
Format
Hardback
Publisher
John Wiley and Sons Ltd
Country
United States
Date
4 February 1998
Pages
190
ISBN
9780471974017