Microelectronics Manufacturing Diagnostics Handbook

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This handbook is a practical guide to achieving higher manufacturing yields and greater product reliability. Demonstrating how to put a cap on skyrocketing manufacturing costs, the book reveals ways to pinpoint and quickly correct the defects that reduce overall manufacturing yield. Packed with methods and procedures, this reference should help solve the toughest electronic manufacturing problems. The book includes a variety of techniques, including process monitoring, inspection, electrical testing, failure analysis, and reliability testing for identifying and isolating stubborn deviations; a spectrum of diagnostic approaches - from the simplest bar code reader used in creating manufacturing traceability - to the most sophisticated analysis technique for identifying the origin of surface contaminants; up-to-date coverage of process modeling and artificial intelligence; and several sections devoted exclusively to solving non-semiconductor manufacturing problems.