Advances in x-Ray Analysis: Proccedings of the Forty-Second Annual Conference on Applications of X-Ray Analysis Held in Denver, Colorado, August 2-6,

John V. Gilfrich (Sachs/Freeman Associates/NRL, Washington, DC, USA)

Format
Hardback
Publisher
Kluwer Academic Publishers Group
Country
NL
Published
30 September 1994
Pages
778
ISBN
9780306449017

Advances in x-Ray Analysis: Proccedings of the Forty-Second Annual Conference on Applications of X-Ray Analysis Held in Denver, Colorado, August 2-6,

John V. Gilfrich (Sachs/Freeman Associates/NRL, Washington, DC, USA)

Selected papers from the 1993 Denver Conference on Applications of X-Ray Analysis. International experts present the latest research in the field, with special coverage of the impact of personal computers and sophisticated software on the development of X-ray instrumentation and techniques. Annotati

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