Monte Carlo Modeling for Electron Microscopy and Microanalysis
David C. Joy (Director, Electron Microscope Facility, Director, Electron Microscope Facility, University of Tennessee)
Monte Carlo Modeling for Electron Microscopy and Microanalysis
David C. Joy (Director, Electron Microscope Facility, Director, Electron Microscope Facility, University of Tennessee)
This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Students and professionals using electron microscopes will want to read this important addition to the literature.
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