Reliability Analysis and Plans for Successive Testing: Start-up Demonstration Tests and Applications

N. Balakrishnan (Professor of Statistics, Department of Mathematics and Statistics McMaster University Hamilton, Ontario, Canada; visiting Professor, King Abdulaziz University, Jeddah, Saudi Arabi),Markos Koutras (Department of Statistics and Insurance Science, University of Piraeus and Dean of the School of Finance and Statistics, Piraeus, Greece),Fotios Milienos (Postdoctoral fellow, Department of Mathematics and Statistics, McMaster University, Ontario, Canada)

Reliability Analysis and Plans for Successive Testing: Start-up Demonstration Tests and Applications
Format
Hardback
Publisher
Elsevier Science Publishing Co Inc
Country
United States
Published
21 January 2021
Pages
266
ISBN
9780128042885

Reliability Analysis and Plans for Successive Testing: Start-up Demonstration Tests and Applications

N. Balakrishnan (Professor of Statistics, Department of Mathematics and Statistics McMaster University Hamilton, Ontario, Canada; visiting Professor, King Abdulaziz University, Jeddah, Saudi Arabi),Markos Koutras (Department of Statistics and Insurance Science, University of Piraeus and Dean of the School of Finance and Statistics, Piraeus, Greece),Fotios Milienos (Postdoctoral fellow, Department of Mathematics and Statistics, McMaster University, Ontario, Canada)

Reliability Analysis and Plans for Successive Testing: Start-up Demonstration Tests and Applications discusses all past and recent developments on start-up demonstration tests in the context of current numerical and illustrative examples to clarify available methods for distribution theorists and applied mathematicians dealing with control problems. Throughout the book, the authors focus on the panorama of open problems and issues of further interest. As contemporary manufacturers face tremendous commercial pressures to assemble works of high reliability, defined as ‘the probability of the product performing its role under the stated conditions and over a specified period of time’, this book helps address testing issues.

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