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Add to list Added to list Scanning Electron Microscopy and X-Ray Microanalysis
Joseph I. Goldstein,Dale E. Newbury,Joseph R. Michael,Nicholas W.M. Ritchie,John Henry J. Scott
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry…
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