Search: ‘David C. Joy’

Helium Ion Microscopy: Principles and Applications

David C. Joy

Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions - such as the Helium Ion Microscope…

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Monte Carlo Modeling for Electron Microscopy and Microanalysis

David C. Joy (Director, Electron Microscope Facility, Director, Electron Microscope Facility, University of Tennessee)

A practical guide to the use of Monte Carlo simulation techniques for the study of electron solid interactions in the electron microscope. Programs, optimized for use on personal computers, are…

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Introduction to Electron Holography

Experienced and novice holographers receive a solid foundation in the theory and practice of holography, the next generation of imaging technology, in this superb text. The book’s “how to’ aspects…

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Subaltern Historiography: A Reader

David C I Joy,Ebenezer Shinekumar

These essays truly propose a paradigm for reading the history and theology from a subaltern viewpoint. Since the essays are prepared by scholars across the globe, it will create a…

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Principles of Analytical Electron Microscopy

All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention.

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Principles of Analytical Electron Microscopy

All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention.

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Joys of Teaching Anthropology

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Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Patrick Echlin,C.E. Fiori,Joseph Goldstein,David C. Joy,Dale E. Newbury

This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.

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Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Patrick Echlin,C.E. Fiori,Joseph Goldstein,David C. Joy,Dale E. Newbury

This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.

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Cover image for The Joy of Retirement: Finding Happiness, Freedom, and the Life You've Always Wanted

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The Joy of Retirement: Finding Happiness, Freedom, and the Life You’ve Always Wanted

David C. BORCHARD,Patricia A. DONOHOE

Author David Borchard has been helping adults rejuvenate their careers and lives for 30 years. In The Joy of Retirement, he shows readers how to reinvent themselves and achieve the…

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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists

Joseph Goldstein,Dale E. Newbury,Patrick Echlin,David C. Joy,Charles Fiori

In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic…

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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

Joseph Goldstein,Dale E. Newbury,David C. Joy,Charles E. Lyman,Patrick Echlin

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning…

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Scanning Electron Microscopy and X-Ray Microanalysis

Joseph I. Goldstein,Dale E. Newbury,Joseph R. Michael,Nicholas W.M. Ritchie,John Henry J. Scott

This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry…

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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

Joseph Goldstein,Dale E. Newbury,David C. Joy,Charles E. Lyman,Patrick Echlin

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning…

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Scanning Electron Microscopy and X-Ray Microanalysis

Joseph I. Goldstein,Dale E. Newbury,Joseph R. Michael,Nicholas W.M. Ritchie,John Henry J. Scott

An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical…

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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists

Joseph Goldstein,Dale E. Newbury,Patrick Echlin,David C. Joy,Alton D. Romig Jr.

In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic…

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Cover image for Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook

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Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook

Charles E. Lyman,Dale E. Newbury,Joseph Goldstein,David B. Williams,Alton D. Romig Jr.

The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope.

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