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      Cover image for Rapid Reliability Assessment of VLSICs
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      Rapid Reliability Assessment of VLSICs

      A.P. Dorey,B.K. Jones,A.M.D. Richardson,Y.Z. Xu

      The increasing application of integrated circuits in situations where high reliability is needed places a requirement on the manufacturer to use methods of testing to eliminate devices that may fail…

      $350.99

      Available to order, ships in approx 4 weeksAvailable to order

      Cover image for Rapid Reliability Assessment of VLSICs
      Paperback
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      Rapid Reliability Assessment of VLSICs

      A.P. Dorey,B.K. Jones,A.M.D. Richardson,Y.Z. Xu,Y Z Xu

      The increasing application of integrated circuits in situations where high reliability is needed places a requirement on the manufacturer to use methods of testing to eliminate devices that may fail…

      $138.99

      Available to order, ships in 7-14 daysAvailable to order