Search results for ‘Laung-Terng Wang (SynTest Technologies, Inc., Sunnyvale, CA, USA),Cheng-Wen Wu (National Tsing Hua University, Hsinchu, Taiwan.),Xiaoqing Wen (Kyushu Institute of Technology, Fukuoka, Japan.)’

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      VLSI Test Principles and Architectures: Design for Testability

      Laung-Terng Wang (SynTest Technologies, Inc., Sunnyvale, CA, USA),Cheng-Wen Wu (National Tsing Hua University, Hsinchu, Taiwan.),Xiaoqing Wen (Kyushu Institute of Technology, Fukuoka, Japan.)

      A comprehensive guide to DFT methods that shows the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up…

      $108.95

      Available to order, ships in approx 2 weeksAvailable to order