Search results for ‘Pierre-Richard Dahoo,Philippe Pougnet,Abdelkhalak El Hami’

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      Cover image for Nanometer-scale Defect Detection Using Polarized Light
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      Nanometer-scale Defect Detection Using Polarized Light

      Pierre-Richard Dahoo,Philippe Pougnet,Abdelkhalak El Hami

      This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques…

      $414.99

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      Cover image for Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method
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      Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method

      Pierre-Richard Dahoo,Philippe Pougnet,Abdelkhalak El Hami

      Nanoscience, nanotechnologies and the laws of quantum physics are sources of disruptive innovation that open up new fields of application. Quantum engineering enables the development of very sensitive materials, sensor…

      $414.99

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      Cover image for Applications and Metrology at Nanometer-Scale 1 - Smart Materials, Electromagnetic Waves and Uncertainties
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      Applications and Metrology at Nanometer-Scale 1 - Smart Materials, Electromagnetic Waves and Uncertainties

      PR Dahoo,Philippe Pougnet,Abdelkhalak El Hami

      To develop innovations in quantum engineering and nanosystems, designers need to adopt the expertise that has been developed in research laboratories. This requires a thorough understanding of the experimental measurement…

      $414.99

      Available to order, ships in 7-14 daysAvailable to order