Search results for ‘Paul S. Ho (University of Texas, Austin),Chao-Kun Hu,Martin Gall,Valeriy Sukharev’

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      Cover image for Electromigration in Metals: Fundamentals to Nano-Interconnects
      Hardback
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      Electromigration in Metals: Fundamentals to Nano-Interconnects

      Paul S. Ho (University of Texas, Austin),Chao-Kun Hu,Martin Gall,Valeriy Sukharev

      Learn to assess electromigration reliability, and design more resilient chips, from this comprehensive resource. Building from fundamental physics to advanced methodologies, this book enables the reader to develop highly reliable…

      $335.99

      Available to order, ships in approx 4 weeksAvailable to order