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Add to list Added to list Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Joseph Goldstein,Dale E. Newbury,David C. Joy,Charles E. Lyman,Patrick Echlin
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning…
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