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      Cover image for Advances in X-ray Analysis: Proceedings of the Sixteenth Annual Conference on Applications of X-Ray Analysis Held August 9-11, 1967 Volume 11
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      Advances in X-ray Analysis: Proceedings of the Sixteenth Annual Conference on Applications of X-Ray Analysis Held August 9-11, 1967 Volume 11

      John B. Newkirk,Gavin R. Mallett,Heinz G. Pfeiffer

      X-ray emission spectrography, while based on Moseley’s work, as a generally useful analytical method had its genesis in the work of Friedman, Birks, and Brooks 30 years ago.

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