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Add to list Added to list Quantitative X-Ray Spectrometry
Ron Jenkins,R. W. Gould,Dale Gedcke,Dale Gedcke (EG&G ORTEC, Oak Ridge, Tennessee, USA)
Covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This title explicates the use of combined X-ray fluorescence and X-ray diffraction…
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