Nanolithography and Surface Microscopy with Electron Beams: Volume 231

Nanolithography and Surface Microscopy with Electron Beams: Volume 231
Format
Hardback
Publisher
Elsevier Science Publishing Co Inc
Country
United States
Published
1 November 2024
Pages
406
ISBN
9780443314629

Nanolithography and Surface Microscopy with Electron Beams: Volume 231

Nanolithography and Surface Microscopy with Electron Beams, Volume 231 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary.

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