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Add to list Added to list Scanning Probe Microscopy: A Multidisciplinary Research Tool
Jayne C Garno (Louisiana State Univ, Usa),Song Xu (Park System Inc., Usa),Jing-jiang Yu (Hitachi High-technologies America Inc., Usa)
One may think that scanning probe microscopy (SPM) instruments are mainly used to ‘look’ at a surface, as with an optical microscope. However, SPM encompasses dozens of measurement and lithography…
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